Fluorescence quantum yield of CdSe/ZnS nanocrystals investigated by correlated atomic-force and single-particle fluorescence microscopy

Y. Ebenstein; T. Mokari; U. Banin

doi:10.1063/1.1482785

Fluorescence quantum yield of CdSe/ZnS nanocrystals investigated by correlated atomic-force and single-particle fluorescence microscopy

Y. Ebenstein^*, T. Mokari, U. Banin

^*Corresponding author for this work

Institute of Chemistry

Research output: Contribution to journal › Article › peer-review

204 Scopus citations

Abstract

Correlated atomic-force and fluorescence microscopy are used to study single-particle versus ensemble fluorescence quantum yields (QY) of semiconductor nanocrystals by measuring a simultaneous map of the topography and the single-particle fluorescence. CdSe/ZnS nanocrystal quantum dots and quantum rods with high QY were investigated. A significant portion of dark particles is detected. Comparison with the ensemble solution QY shows that samples with higher QY have a larger fraction of bright particles accompanied by an increased single-particle QY. Saturated emission from single nanocrystals could not be detected because of particle darkening under high-power excitation.

Original language	English
Pages (from-to)	4033-4035
Number of pages	3
Journal	Applied Physics Letters
Volume	80
Issue number	21
DOIs	https://doi.org/10.1063/1.1482785
State	Published - 27 May 2002

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abstract = "Correlated atomic-force and fluorescence microscopy are used to study single-particle versus ensemble fluorescence quantum yields (QY) of semiconductor nanocrystals by measuring a simultaneous map of the topography and the single-particle fluorescence. CdSe/ZnS nanocrystal quantum dots and quantum rods with high QY were investigated. A significant portion of dark particles is detected. Comparison with the ensemble solution QY shows that samples with higher QY have a larger fraction of bright particles accompanied by an increased single-particle QY. Saturated emission from single nanocrystals could not be detected because of particle darkening under high-power excitation.",

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AB - Correlated atomic-force and fluorescence microscopy are used to study single-particle versus ensemble fluorescence quantum yields (QY) of semiconductor nanocrystals by measuring a simultaneous map of the topography and the single-particle fluorescence. CdSe/ZnS nanocrystal quantum dots and quantum rods with high QY were investigated. A significant portion of dark particles is detected. Comparison with the ensemble solution QY shows that samples with higher QY have a larger fraction of bright particles accompanied by an increased single-particle QY. Saturated emission from single nanocrystals could not be detected because of particle darkening under high-power excitation.

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Fluorescence quantum yield of CdSe/ZnS nanocrystals investigated by correlated atomic-force and single-particle fluorescence microscopy

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