Frequency dependence of the kosterlitz-thouless phase transition in helium films

S. Ben Ezra, W. I. Glaberson

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

We have observed shifts of the Kosteflitz-Thouless phase transition in thin Helium films associated with changing of the substrate oscillation frequency. Measurements were carried out using a single substrate driven at megahertz frequencies. A quartz crystal oscillator was operated in two different harmonic modes (first and third), essentially simultaneously. Great care was taken to operate at sufficiently low drive amplitudes so that nonlinear effects were minimized. We observed that the critical film thickness shifts to lower values at higher frequencies. This is presumably a consequence of the finite vortex diffusivity and therefore limited response frequency of thermally activated vortex pairs.

Original languageEnglish
Pages (from-to)433-434
Number of pages2
JournalCzechoslovak Journal of Physics
Volume46
Issue numberSUPPL. 1
DOIs
StatePublished - 1996

Fingerprint

Dive into the research topics of 'Frequency dependence of the kosterlitz-thouless phase transition in helium films'. Together they form a unique fingerprint.

Cite this