TY - JOUR
T1 - Genetic dissection of quantitative powdery mildew resistance loci in tetraploid wheat
AU - Ben-David, Roi
AU - Peleg, Zvi
AU - Dinoor, Amos
AU - Saranga, Yehoshua
AU - Korol, Abraham B.
AU - Fahima, Tzion
N1 - Publisher Copyright:
© 2014, Springer Science+Business Media Dordrecht.
PY - 2014/12/6
Y1 - 2014/12/6
N2 - Durum wheat, Triticum turgidum ssp. durum Desf., is an important crop particularly in the Mediterranean basin. Powdery mildew, caused by the pathogen Blumeria graminis f. sp. tritici (Bgt), is a major disease of wheat that results in significant yield losses worldwide. A recombinant inbred line (RIL) population, derived from a cross between durum wheat and wild emmer wheat, T. turgidum ssp. dicoccoides, was used for genomic dissection of quantitative and qualitative resistance loci against wheat powdery mildew based on a genomic map of >600 markers, evenly distributed across the A and B genomes of tetraploid wheat. The genetic analysis of the phenotypic reactions of the RIL population to two Bgt isolates revealed two different resistance mechanisms. The first is monogenic: a wild emmer wheat allele in a single locus conferring complete resistance to Bgt#15, previously designated as PmG16. The second one is polygenic: a set of durum wheat alleles, in five independent QTLs that control partial resistance to Bgt#66 in the RIL population, with a LOD score range of 3.4–19.8. One of them is a major quantitative resistance locus (QRL) that was mapped on chromosome 1A and explains 26.4 % of the variance. In most of the detected QRLs, the durum wheat alleles conferred resistance to powdery mildew. These findings are exceptional in the sense that, so far, only a few Pm alleles originated from a durum wheat background. Therefore, our results emphasize the high potential of exploiting the wide genetic diversity of tetraploid wheat germplasm for wheat breeding using modern wheat genomics tools.
AB - Durum wheat, Triticum turgidum ssp. durum Desf., is an important crop particularly in the Mediterranean basin. Powdery mildew, caused by the pathogen Blumeria graminis f. sp. tritici (Bgt), is a major disease of wheat that results in significant yield losses worldwide. A recombinant inbred line (RIL) population, derived from a cross between durum wheat and wild emmer wheat, T. turgidum ssp. dicoccoides, was used for genomic dissection of quantitative and qualitative resistance loci against wheat powdery mildew based on a genomic map of >600 markers, evenly distributed across the A and B genomes of tetraploid wheat. The genetic analysis of the phenotypic reactions of the RIL population to two Bgt isolates revealed two different resistance mechanisms. The first is monogenic: a wild emmer wheat allele in a single locus conferring complete resistance to Bgt#15, previously designated as PmG16. The second one is polygenic: a set of durum wheat alleles, in five independent QTLs that control partial resistance to Bgt#66 in the RIL population, with a LOD score range of 3.4–19.8. One of them is a major quantitative resistance locus (QRL) that was mapped on chromosome 1A and explains 26.4 % of the variance. In most of the detected QRLs, the durum wheat alleles conferred resistance to powdery mildew. These findings are exceptional in the sense that, so far, only a few Pm alleles originated from a durum wheat background. Therefore, our results emphasize the high potential of exploiting the wide genetic diversity of tetraploid wheat germplasm for wheat breeding using modern wheat genomics tools.
KW - Blumeria graminis f. sp. tritici
KW - Durum wheat
KW - Powdery mildew
KW - QRL
KW - Quantitative resistance
KW - Wild emmer wheat
UR - http://www.scopus.com/inward/record.url?scp=84914818474&partnerID=8YFLogxK
U2 - 10.1007/s11032-014-0178-0
DO - 10.1007/s11032-014-0178-0
M3 - ???researchoutput.researchoutputtypes.contributiontojournal.article???
AN - SCOPUS:84914818474
SN - 1380-3743
VL - 34
SP - 1647
EP - 1658
JO - Molecular Breeding
JF - Molecular Breeding
IS - 4
ER -