TY - JOUR
T1 - Glancing angle Talbot-Lau grating interferometers for phase contrast imaging at high x-ray energy
AU - Stutman, D.
AU - Finkenthal, M.
PY - 2012/8/27
Y1 - 2012/8/27
N2 - A Talbot-Lau interferometer is demonstrated using micro-periodic gratings inclined at a glancing angle along the light propagation direction. Due to the increase in the effective thickness of the absorption gratings, the device enables differential phase contrast imaging at high x-ray energy, with improved fringe visibility (contrast). For instance, at 28° glancing angle, we obtain up to ∼35 overall interferometer contrast with a spectrum having ∼43 keV mean energy, suitable for medical applications. In addition, glancing angle interferometers could provide high contrast at energies above 100 keV, enabling industrial and security applications of phase contrast imaging.
AB - A Talbot-Lau interferometer is demonstrated using micro-periodic gratings inclined at a glancing angle along the light propagation direction. Due to the increase in the effective thickness of the absorption gratings, the device enables differential phase contrast imaging at high x-ray energy, with improved fringe visibility (contrast). For instance, at 28° glancing angle, we obtain up to ∼35 overall interferometer contrast with a spectrum having ∼43 keV mean energy, suitable for medical applications. In addition, glancing angle interferometers could provide high contrast at energies above 100 keV, enabling industrial and security applications of phase contrast imaging.
UR - http://www.scopus.com/inward/record.url?scp=84865858246&partnerID=8YFLogxK
U2 - 10.1063/1.4748882
DO - 10.1063/1.4748882
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AN - SCOPUS:84865858246
SN - 0003-6951
VL - 101
JO - Applied Physics Letters
JF - Applied Physics Letters
IS - 9
M1 - 091108
ER -