Growth, electrical and optical properties of SnO2: F on ZnO, Si and porous Si structures

A. Ferreira Da Silva, M. V.Castro Meira, G. Baldissera, C. Persson, N. Gutman, A. Sáar, P. Klason, M. Willander, C. D. Canestraro, T. V. Moreno, L. S. Roman

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this work we have analyzed the optical absorption of the ZnO and SnO2:F (FTO) films and applied them in porous silicon light-emitting diodes. The absorption and energy gap were calculated by employing the projector augmented wave method [1] within the local density approximation and with a modeled on-site self-interaction-like correction potential within the LDA+U SIC [2]. Experiment and theory show a good agreement when the optical absorption and optical energy gap are considered. A layer of FTO is deposited by spray pyrolysis on top of porous Si (PSi) or ZnO/(PSi) in order to make the LEDs. The morphology and roughness of the films are analyzed by Atomic Force Microscopy before and after the FTO deposition. The electrical and optical properties are studied by characteristics curves J × V, and electroluminescence intensity versus bias.

Original languageEnglish
Title of host publicationNanotechnology 2009
Subtitle of host publicationFabrication, Particles, Characterization, MEMS, Electronics and Photonics - Technical Proceedings of the 2009 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2009
Pages352-355
Number of pages4
StatePublished - 2009
EventNanotechnology 2009: Fabrication, Particles, Characterization, MEMS, Electronics and Photonics - 2009 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2009 - Houston, TX, United States
Duration: 3 May 20097 May 2009

Publication series

NameNanotechnology 2009: Fabrication, Particles, Characterization, MEMS, Electronics and Photonics - Technical Proceedings of the 2009 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2009
Volume1

Conference

ConferenceNanotechnology 2009: Fabrication, Particles, Characterization, MEMS, Electronics and Photonics - 2009 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2009
Country/TerritoryUnited States
CityHouston, TX
Period3/05/097/05/09

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