A double-layer Hall-probe array was used to measure the in-plane and the normal component of the induction field near the surface of a superconducting sample. This technique finds applications in measuring the current distribution across the sample and in characterizing the flux creep process in flat samples. Both applications have been demonstrated in a thin YBa2Cu3O7 crystal in the remanent state.
|Original language||American English|
|Number of pages||3|
|Journal||Journal of Applied Physics|
|Issue number||8 II B|
|State||Published - 15 Apr 1999|
|Event||Proceedings of the 43rd Annual Conference on Magnetism and Magnetic Materials - Miami, FL, USA|
Duration: 9 Nov 1998 → 12 Nov 1998