Abstract
A double-layer Hall-probe array was used to measure the in-plane and the normal component of the induction field near the surface of a superconducting sample. This technique finds applications in measuring the current distribution across the sample and in characterizing the flux creep process in flat samples. Both applications have been demonstrated in a thin YBa2Cu3O7 crystal in the remanent state.
Original language | English |
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Pages (from-to) | 5471-5473 |
Number of pages | 3 |
Journal | Journal of Applied Physics |
Volume | 85 |
Issue number | 8 II B |
DOIs | |
State | Published - 15 Apr 1999 |
Externally published | Yes |
Event | Proceedings of the 43rd Annual Conference on Magnetism and Magnetic Materials - Miami, FL, USA Duration: 9 Nov 1998 → 12 Nov 1998 |