Hierarchical symmetry

H. Zabrodsky; S. Peleg; D. Avnir

doi:10.1109/ICPR.1992.201915

Hierarchical symmetry

H. Zabrodsky
, S. Peleg
, D. Avnir

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

24 Scopus citations

Abstract

We view symmetry as a continuous feature and dependent on resolution. Combining a Continuous Symmetry Measure (CSM) with a multiresolution scheme, we present a method that hierarchically detects symmetric and almost symmetric patterns. Evaluation of symmetry at low frequencies guides the process to find the symmetry at higher frequencies.

Original language	English
Title of host publication	IAPR 1992 - 11th IAPR International Conference on Pattern Recognition
Subtitle of host publication	Image, Speech, and Signal Analysis
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	9-12
Number of pages	4
ISBN (Electronic)	0818629207
DOIs	https://doi.org/10.1109/ICPR.1992.201915
State	Published - 1992
Event	11th IAPR International Conference on Pattern Recognition, IAPR 1992 - The Hague, Netherlands Duration: 30 Aug 1992 → 3 Sep 1992

Publication series

Name	Proceedings - International Conference on Pattern Recognition
Volume	3
ISSN (Print)	1051-4651

Conference

Conference	11th IAPR International Conference on Pattern Recognition, IAPR 1992
Country/Territory	Netherlands
City	The Hague
Period	30/08/92 → 3/09/92

Bibliographical note

Publisher Copyright:
© 1992 IEEE.

Access to Document

10.1109/ICPR.1992.201915

Cite this

Zabrodsky, H., Peleg, S., & Avnir, D. (1992). Hierarchical symmetry. In IAPR 1992 - 11th IAPR International Conference on Pattern Recognition: Image, Speech, and Signal Analysis (pp. 9-12). Article 201915 (Proceedings - International Conference on Pattern Recognition; Vol. 3). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICPR.1992.201915

@inproceedings{2119a7bd7d4c4a8baf20d9717b3172ab,

title = "Hierarchical symmetry",

abstract = "We view symmetry as a continuous feature and dependent on resolution. Combining a Continuous Symmetry Measure (CSM) with a multiresolution scheme, we present a method that hierarchically detects symmetric and almost symmetric patterns. Evaluation of symmetry at low frequencies guides the process to find the symmetry at higher frequencies.",

author = "H. Zabrodsky and S. Peleg and D. Avnir",

note = "Publisher Copyright: {\textcopyright} 1992 IEEE.; 11th IAPR International Conference on Pattern Recognition, IAPR 1992 ; Conference date: 30-08-1992 Through 03-09-1992",

year = "1992",

doi = "10.1109/ICPR.1992.201915",

language = "אנגלית",

series = "Proceedings - International Conference on Pattern Recognition",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "9--12",

booktitle = "IAPR 1992 - 11th IAPR International Conference on Pattern Recognition",

address = "ארצות הברית",

}

Zabrodsky, H, Peleg, S & Avnir, D 1992, Hierarchical symmetry. in IAPR 1992 - 11th IAPR International Conference on Pattern Recognition: Image, Speech, and Signal Analysis., 201915, Proceedings - International Conference on Pattern Recognition, vol. 3, Institute of Electrical and Electronics Engineers Inc., pp. 9-12, 11th IAPR International Conference on Pattern Recognition, IAPR 1992, The Hague, Netherlands, 30/08/92. https://doi.org/10.1109/ICPR.1992.201915

Hierarchical symmetry. / Zabrodsky, H.; Peleg, S.; Avnir, D.
IAPR 1992 - 11th IAPR International Conference on Pattern Recognition: Image, Speech, and Signal Analysis. Institute of Electrical and Electronics Engineers Inc., 1992. p. 9-12 201915 (Proceedings - International Conference on Pattern Recognition; Vol. 3).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Hierarchical symmetry

AU - Zabrodsky, H.

AU - Peleg, S.

AU - Avnir, D.

PY - 1992

Y1 - 1992

N2 - We view symmetry as a continuous feature and dependent on resolution. Combining a Continuous Symmetry Measure (CSM) with a multiresolution scheme, we present a method that hierarchically detects symmetric and almost symmetric patterns. Evaluation of symmetry at low frequencies guides the process to find the symmetry at higher frequencies.

AB - We view symmetry as a continuous feature and dependent on resolution. Combining a Continuous Symmetry Measure (CSM) with a multiresolution scheme, we present a method that hierarchically detects symmetric and almost symmetric patterns. Evaluation of symmetry at low frequencies guides the process to find the symmetry at higher frequencies.

UR - https://www.scopus.com/pages/publications/84884187145

U2 - 10.1109/ICPR.1992.201915

DO - 10.1109/ICPR.1992.201915

M3 - ???researchoutput.researchoutputtypes.contributiontobookanthology.conference???

AN - SCOPUS:84884187145

T3 - Proceedings - International Conference on Pattern Recognition

SP - 9

EP - 12

BT - IAPR 1992 - 11th IAPR International Conference on Pattern Recognition

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 11th IAPR International Conference on Pattern Recognition, IAPR 1992

Y2 - 30 August 1992 through 3 September 1992

ER -

Hierarchical symmetry

Abstract

Publication series

Conference

Bibliographical note

Access to Document

Other files and links

Fingerprint

Cite this