TY - JOUR
T1 - High-resolution X-ray measurements of the A transition in the polymeric liquid crystal P4.1 polysiloxane
AU - Keller, Edward N.
AU - Halfon, Rivka
AU - Nachaliel, Ehud
AU - Davidov, Dan
AU - Zimmermann, Herbert
PY - 1988
Y1 - 1988
N2 - We report on the first high-resolution x-ray measurements of a second-order nematic to (bilayer) smectic-A phase transition in a polymeric liquid crystal, P4.1 polysiloxane. The critical exponents of the parallel and perpendicular correlation lengths and susceptibility were N=0.77±N0.05, N=0.57±N 0.08, and =1.33±N0.10, respectively. The bare correlation lengths, N 0q0 and N0q0, were 3.27 ±N 0.08 and 1.09 ±N 0.14, respectively, and are unusually large in comparison to monomeric liquid crystals.
AB - We report on the first high-resolution x-ray measurements of a second-order nematic to (bilayer) smectic-A phase transition in a polymeric liquid crystal, P4.1 polysiloxane. The critical exponents of the parallel and perpendicular correlation lengths and susceptibility were N=0.77±N0.05, N=0.57±N 0.08, and =1.33±N0.10, respectively. The bare correlation lengths, N 0q0 and N0q0, were 3.27 ±N 0.08 and 1.09 ±N 0.14, respectively, and are unusually large in comparison to monomeric liquid crystals.
UR - http://www.scopus.com/inward/record.url?scp=4243296348&partnerID=8YFLogxK
U2 - 10.1103/PhysRevLett.61.1206
DO - 10.1103/PhysRevLett.61.1206
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AN - SCOPUS:4243296348
SN - 0031-9007
VL - 61
SP - 1206
EP - 1209
JO - Physical Review Letters
JF - Physical Review Letters
IS - 10
ER -