High-resolution X-ray measurements of the A transition in the polymeric liquid crystal P4.1 polysiloxane

Edward N. Keller*, Rivka Halfon, Ehud Nachaliel, Dan Davidov, Herbert Zimmermann

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

We report on the first high-resolution x-ray measurements of a second-order nematic to (bilayer) smectic-A phase transition in a polymeric liquid crystal, P4.1 polysiloxane. The critical exponents of the parallel and perpendicular correlation lengths and susceptibility were N=0.77±N0.05, N=0.57±N 0.08, and =1.33±N0.10, respectively. The bare correlation lengths, N 0q0 and N0q0, were 3.27 ±N 0.08 and 1.09 ±N 0.14, respectively, and are unusually large in comparison to monomeric liquid crystals.

Original languageEnglish
Pages (from-to)1206-1209
Number of pages4
JournalPhysical Review Letters
Volume61
Issue number10
DOIs
StatePublished - 1988

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