Abstract
The structures of AlB2 and Mn5Si3-type hexagonal and Cr5B3 and ThCr2Si2 type tetragonal rare-earth silicides have been investigated by a high-temperature X-ray diffraction method in the temperature range 20 °-1200 °C. Thermal expansion coefficients and transition products of the different compounds are given.
Original language | English |
---|---|
Pages (from-to) | 25-31 |
Number of pages | 7 |
Journal | Journal of the Less-Common Metals |
Volume | 29 |
Issue number | 1 |
DOIs | |
State | Published - Sep 1972 |