High-temperature X-ray study of rare-earth silicides

I. Mayer*, I. Felner

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

42 Scopus citations

Abstract

The structures of AlB2 and Mn5Si3-type hexagonal and Cr5B3 and ThCr2Si2 type tetragonal rare-earth silicides have been investigated by a high-temperature X-ray diffraction method in the temperature range 20 °-1200 °C. Thermal expansion coefficients and transition products of the different compounds are given.

Original languageEnglish
Pages (from-to)25-31
Number of pages7
JournalJournal of the Less-Common Metals
Volume29
Issue number1
DOIs
StatePublished - Sep 1972

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