High throughput multilayer mirror based soft x-ray spectrometer for metallic impurity emission from tokamaks

A. P. Zwicker*, S. P. Regan, M. Finkenthal, H. W. Moos

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

A near-normal incidence high throughput spectrometer with a flat multilayer mirror (MLM) as the dispersive element has been built and operated on the Texas Experimental Tokamak (TEXT). Using a Mo/B4C MLM that has a reflectivity of 20-30% and a bandpass of 4-9 Å (FWHM), the instrument has a wavelength range of 90-180 Å. The spectra obtained with this instrument have been compared to an artificial spectrum based upon a collisional-radiative model. From this comparison it is possible to identify the dominant titanium emission lines responsible for the broadband shape of the low-resolution experimental spectrum. This work is part of our continuing development of simple, near-normal incidence high throughput spectrometers for tokamak plasma diagnostics.

Original languageEnglish
Pages (from-to)2786-2788
Number of pages3
JournalReview of Scientific Instruments
Volume61
Issue number10
DOIs
StatePublished - 1990
Externally publishedYes

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