High throughput multilayer mirror based soft x-ray spectrometer for metallic impurity emission from tokamaks

A. P. Zwicker; S. P. Regan; M. Finkenthal; H. W. Moos

doi:10.1063/1.1141831

High throughput multilayer mirror based soft x-ray spectrometer for metallic impurity emission from tokamaks

A. P. Zwicker^*
, S. P. Regan
, M. Finkenthal
, H. W. Moos

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

A near-normal incidence high throughput spectrometer with a flat multilayer mirror (MLM) as the dispersive element has been built and operated on the Texas Experimental Tokamak (TEXT). Using a Mo/B₄C MLM that has a reflectivity of 20-30% and a bandpass of 4-9 Å (FWHM), the instrument has a wavelength range of 90-180 Å. The spectra obtained with this instrument have been compared to an artificial spectrum based upon a collisional-radiative model. From this comparison it is possible to identify the dominant titanium emission lines responsible for the broadband shape of the low-resolution experimental spectrum. This work is part of our continuing development of simple, near-normal incidence high throughput spectrometers for tokamak plasma diagnostics.

Original language	English
Pages (from-to)	2786-2788
Number of pages	3
Journal	Review of Scientific Instruments
Volume	61
Issue number	10
DOIs	https://doi.org/10.1063/1.1141831
State	Published - 1990
Externally published	Yes

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10.1063/1.1141831

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title = "High throughput multilayer mirror based soft x-ray spectrometer for metallic impurity emission from tokamaks",

abstract = "A near-normal incidence high throughput spectrometer with a flat multilayer mirror (MLM) as the dispersive element has been built and operated on the Texas Experimental Tokamak (TEXT). Using a Mo/B4C MLM that has a reflectivity of 20-30\% and a bandpass of 4-9 {\AA} (FWHM), the instrument has a wavelength range of 90-180 {\AA}. The spectra obtained with this instrument have been compared to an artificial spectrum based upon a collisional-radiative model. From this comparison it is possible to identify the dominant titanium emission lines responsible for the broadband shape of the low-resolution experimental spectrum. This work is part of our continuing development of simple, near-normal incidence high throughput spectrometers for tokamak plasma diagnostics.",

author = "Zwicker, \{A. P.\} and Regan, \{S. P.\} and M. Finkenthal and Moos, \{H. W.\}",

year = "1990",

doi = "10.1063/1.1141831",

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journal = "Review of Scientific Instruments",

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AU - Zwicker, A. P.

AU - Regan, S. P.

AU - Finkenthal, M.

AU - Moos, H. W.

PY - 1990

Y1 - 1990

N2 - A near-normal incidence high throughput spectrometer with a flat multilayer mirror (MLM) as the dispersive element has been built and operated on the Texas Experimental Tokamak (TEXT). Using a Mo/B4C MLM that has a reflectivity of 20-30% and a bandpass of 4-9 Å (FWHM), the instrument has a wavelength range of 90-180 Å. The spectra obtained with this instrument have been compared to an artificial spectrum based upon a collisional-radiative model. From this comparison it is possible to identify the dominant titanium emission lines responsible for the broadband shape of the low-resolution experimental spectrum. This work is part of our continuing development of simple, near-normal incidence high throughput spectrometers for tokamak plasma diagnostics.

AB - A near-normal incidence high throughput spectrometer with a flat multilayer mirror (MLM) as the dispersive element has been built and operated on the Texas Experimental Tokamak (TEXT). Using a Mo/B4C MLM that has a reflectivity of 20-30% and a bandpass of 4-9 Å (FWHM), the instrument has a wavelength range of 90-180 Å. The spectra obtained with this instrument have been compared to an artificial spectrum based upon a collisional-radiative model. From this comparison it is possible to identify the dominant titanium emission lines responsible for the broadband shape of the low-resolution experimental spectrum. This work is part of our continuing development of simple, near-normal incidence high throughput spectrometers for tokamak plasma diagnostics.

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JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

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High throughput multilayer mirror based soft x-ray spectrometer for metallic impurity emission from tokamaks

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