Hot electron schottky detection based on internal photoemission in silicon structures

Boris Desiatov; Noa Mazurski; Joseph Shappir; Jacob B. Khurgin; Uriel Levy

Hot electron schottky detection based on internal photoemission in silicon structures

Boris Desiatov, Noa Mazurski, Joseph Shappir, Jacob B. Khurgin, Uriel Levy

Department of Applied Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

We demonstrate the design, fabrication and characterization of plasmonic enhanced silicon photo-detector for infrared light. Theoretical model, experimental results and comparison between different geometric configurations will be presented and discussed.

Original language	American English
Title of host publication	2015 Conference on Lasers and Electro-Optics, CLEO 2015
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781557529688
State	Published - 10 Aug 2015
Event	Conference on Lasers and Electro-Optics, CLEO 2015 - San Jose, United States Duration: 10 May 2015 → 15 May 2015

Publication series

Name	Conference on Lasers and Electro-Optics Europe - Technical Digest
Volume	2015-August

Conference

Conference	Conference on Lasers and Electro-Optics, CLEO 2015
Country/Territory	United States
City	San Jose
Period	10/05/15 → 15/05/15

Bibliographical note

Publisher Copyright:
© 2015 OSA.

Keywords

Detectors
Optical surface waves
Optical waveguides
Photonics
Silicon
Temperature measurement
Wavelength measurement

Cite this

Desiatov, B., Mazurski, N., Shappir, J., Khurgin, J. B., & Levy, U. (2015). Hot electron schottky detection based on internal photoemission in silicon structures. In 2015 Conference on Lasers and Electro-Optics, CLEO 2015 Article 7183185 (Conference on Lasers and Electro-Optics Europe - Technical Digest; Vol. 2015-August). Institute of Electrical and Electronics Engineers Inc..

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title = "Hot electron schottky detection based on internal photoemission in silicon structures",

abstract = "We demonstrate the design, fabrication and characterization of plasmonic enhanced silicon photo-detector for infrared light. Theoretical model, experimental results and comparison between different geometric configurations will be presented and discussed.",

keywords = "Detectors, Optical surface waves, Optical waveguides, Photonics, Silicon, Temperature measurement, Wavelength measurement",

author = "Boris Desiatov and Noa Mazurski and Joseph Shappir and Khurgin, {Jacob B.} and Uriel Levy",

note = "Publisher Copyright: {\textcopyright} 2015 OSA.; Conference on Lasers and Electro-Optics, CLEO 2015 ; Conference date: 10-05-2015 Through 15-05-2015",

year = "2015",

month = aug,

day = "10",

language = "American English",

series = "Conference on Lasers and Electro-Optics Europe - Technical Digest",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2015 Conference on Lasers and Electro-Optics, CLEO 2015",

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Desiatov, B, Mazurski, N, Shappir, J, Khurgin, JB & Levy, U 2015, Hot electron schottky detection based on internal photoemission in silicon structures. in 2015 Conference on Lasers and Electro-Optics, CLEO 2015., 7183185, Conference on Lasers and Electro-Optics Europe - Technical Digest, vol. 2015-August, Institute of Electrical and Electronics Engineers Inc., Conference on Lasers and Electro-Optics, CLEO 2015, San Jose, United States, 10/05/15.

Hot electron schottky detection based on internal photoemission in silicon structures. / Desiatov, Boris; Mazurski, Noa; Shappir, Joseph et al.
2015 Conference on Lasers and Electro-Optics, CLEO 2015. Institute of Electrical and Electronics Engineers Inc., 2015. 7183185 (Conference on Lasers and Electro-Optics Europe - Technical Digest; Vol. 2015-August).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Hot electron schottky detection based on internal photoemission in silicon structures

AU - Desiatov, Boris

AU - Mazurski, Noa

AU - Shappir, Joseph

AU - Khurgin, Jacob B.

AU - Levy, Uriel

PY - 2015/8/10

Y1 - 2015/8/10

N2 - We demonstrate the design, fabrication and characterization of plasmonic enhanced silicon photo-detector for infrared light. Theoretical model, experimental results and comparison between different geometric configurations will be presented and discussed.

AB - We demonstrate the design, fabrication and characterization of plasmonic enhanced silicon photo-detector for infrared light. Theoretical model, experimental results and comparison between different geometric configurations will be presented and discussed.

KW - Detectors

KW - Optical surface waves

KW - Optical waveguides

KW - Photonics

KW - Silicon

KW - Temperature measurement

KW - Wavelength measurement

UR - http://www.scopus.com/inward/record.url?scp=84954072243&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84954072243

T3 - Conference on Lasers and Electro-Optics Europe - Technical Digest

BT - 2015 Conference on Lasers and Electro-Optics, CLEO 2015

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - Conference on Lasers and Electro-Optics, CLEO 2015

Y2 - 10 May 2015 through 15 May 2015

ER -

Hot electron schottky detection based on internal photoemission in silicon structures

Abstract

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Keywords

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