Imaging the field profile inside dielectric laser acceleration nanostructures

Tal Fishman; Urs Haeusler; Raphael Dahan; Michael Yannai; Yuval Adiv; Tom Lenkiewicz Abudy; Ori Eyal; Peyman Yousefi; Roy Shiloh; Gadi Eisenstein; Peter Hommelhoff; Ido Kaminer

Imaging the field profile inside dielectric laser acceleration nanostructures

Tal Fishman
, Urs Haeusler
, Raphael Dahan
, Michael Yannai
, Yuval Adiv
, Tom Lenkiewicz Abudy
, Ori Eyal
, Peyman Yousefi
, Roy Shiloh
, Gadi Eisenstein
, Peter Hommelhoff
, Ido Kaminer

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We present deep sub-wavelength measurement of the field distribution inside nanophotonic dielectric laser accelerator structures, using photon-induced nearfield electron microscopy. Comparing the measured field with theory provides new insight into accelerators' performance and structural sensitivity.

Original language	English
Title of host publication	2022 Conference on Lasers and Electro-Optics, CLEO 2022 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781957171050
State	Published - 2022
Externally published	Yes
Event	2022 Conference on Lasers and Electro-Optics, CLEO 2022 - San Jose, United States Duration: 15 May 2022 → 20 May 2022

Publication series

Name	2022 Conference on Lasers and Electro-Optics, CLEO 2022 - Proceedings

Conference

Conference	2022 Conference on Lasers and Electro-Optics, CLEO 2022
Country/Territory	United States
City	San Jose
Period	15/05/22 → 20/05/22

Bibliographical note

Publisher Copyright:
© Optica Publishing Group 2022, © 2022 The Author(s)

Cite this

Fishman, T., Haeusler, U., Dahan, R., Yannai, M., Adiv, Y., Abudy, T. L., Eyal, O., Yousefi, P., Shiloh, R., Eisenstein, G., Hommelhoff, P., & Kaminer, I. (2022). Imaging the field profile inside dielectric laser acceleration nanostructures. In 2022 Conference on Lasers and Electro-Optics, CLEO 2022 - Proceedings Article STh5I.5 (2022 Conference on Lasers and Electro-Optics, CLEO 2022 - Proceedings). Institute of Electrical and Electronics Engineers Inc..

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title = "Imaging the field profile inside dielectric laser acceleration nanostructures",

abstract = "We present deep sub-wavelength measurement of the field distribution inside nanophotonic dielectric laser accelerator structures, using photon-induced nearfield electron microscopy. Comparing the measured field with theory provides new insight into accelerators' performance and structural sensitivity.",

author = "Tal Fishman and Urs Haeusler and Raphael Dahan and Michael Yannai and Yuval Adiv and Abudy, \{Tom Lenkiewicz\} and Ori Eyal and Peyman Yousefi and Roy Shiloh and Gadi Eisenstein and Peter Hommelhoff and Ido Kaminer",

note = "Publisher Copyright: {\textcopyright} Optica Publishing Group 2022, {\textcopyright} 2022 The Author(s); 2022 Conference on Lasers and Electro-Optics, CLEO 2022 ; Conference date: 15-05-2022 Through 20-05-2022",

year = "2022",

language = "אנגלית",

series = "2022 Conference on Lasers and Electro-Optics, CLEO 2022 - Proceedings",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2022 Conference on Lasers and Electro-Optics, CLEO 2022 - Proceedings",

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Fishman, T, Haeusler, U, Dahan, R, Yannai, M, Adiv, Y, Abudy, TL, Eyal, O, Yousefi, P, Shiloh, R, Eisenstein, G, Hommelhoff, P & Kaminer, I 2022, Imaging the field profile inside dielectric laser acceleration nanostructures. in 2022 Conference on Lasers and Electro-Optics, CLEO 2022 - Proceedings., STh5I.5, 2022 Conference on Lasers and Electro-Optics, CLEO 2022 - Proceedings, Institute of Electrical and Electronics Engineers Inc., 2022 Conference on Lasers and Electro-Optics, CLEO 2022, San Jose, United States, 15/05/22.

Imaging the field profile inside dielectric laser acceleration nanostructures. / Fishman, Tal; Haeusler, Urs; Dahan, Raphael et al.
2022 Conference on Lasers and Electro-Optics, CLEO 2022 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2022. STh5I.5 (2022 Conference on Lasers and Electro-Optics, CLEO 2022 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Imaging the field profile inside dielectric laser acceleration nanostructures

AU - Fishman, Tal

AU - Haeusler, Urs

AU - Dahan, Raphael

AU - Yannai, Michael

AU - Adiv, Yuval

AU - Abudy, Tom Lenkiewicz

AU - Eyal, Ori

AU - Yousefi, Peyman

AU - Shiloh, Roy

AU - Eisenstein, Gadi

AU - Hommelhoff, Peter

AU - Kaminer, Ido

PY - 2022

Y1 - 2022

N2 - We present deep sub-wavelength measurement of the field distribution inside nanophotonic dielectric laser accelerator structures, using photon-induced nearfield electron microscopy. Comparing the measured field with theory provides new insight into accelerators' performance and structural sensitivity.

AB - We present deep sub-wavelength measurement of the field distribution inside nanophotonic dielectric laser accelerator structures, using photon-induced nearfield electron microscopy. Comparing the measured field with theory provides new insight into accelerators' performance and structural sensitivity.

UR - https://www.scopus.com/pages/publications/85139966500

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AN - SCOPUS:85139966500

T3 - 2022 Conference on Lasers and Electro-Optics, CLEO 2022 - Proceedings

BT - 2022 Conference on Lasers and Electro-Optics, CLEO 2022 - Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2022 Conference on Lasers and Electro-Optics, CLEO 2022

Y2 - 15 May 2022 through 20 May 2022

ER -

Imaging the field profile inside dielectric laser acceleration nanostructures

Abstract

Publication series

Conference

Bibliographical note

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Cite this