Inert two-dimensional accumulation layers at the free ZnO surface produced by hydrogen implantation

A. Many*, Y. Goldstein, G. Yaron, J. Levy

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

Low-energy hydrogen-ion implantation is use to produced extremely strong electron accumulation layers on ZnO. Such layers are 10-20 Å wide and resemble closely accumulation layers obtained by conventional methods. They are, however, completely insensitive to oxygen and thus constitute the only two-dimensional electron gas system on a surface that is both free and inert.

Original languageEnglish
Pages (from-to)416-421
Number of pages6
JournalSurface Science
Volume170
Issue number1-2
DOIs
StatePublished - 3 Apr 1986

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