Innovative metrology method for the 3-dimensional measurement of MEMS structures

  • Shay Wolfling*
  • , David Banitt
  • , Nissim Ben-Yosef
  • , Yoel Arieli
  • *Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

6 Scopus citations

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Engineering

Physics

Earth and Planetary Sciences