Abstract
Summary form only given. A microscopic analysis of the photorefractive effect in KTa1-x Nbx03:Cu,V (KTN) is discussed. All relevant parameters which enter into the Kukhtarev model of the photorefractive effect were independently measured. Cu is found to be the partially filled donor level responsible for the photorefractive effect. The total Cu concentration was determined from electron microprobe analysis to be 1.8(1019) cm-3. A series of oxidation and reduction treatments was used to alter the concentration of Cu1+ and Cu2+. The concentration of Cu in each valence state after each heat treatment was determined using the relative magnitudes of the Cu1+ charge transfer band and the Cu2+ crystal field transition. The electron photoexcitation cross section at 514 nm was determined to be 9.08(10-20) cm-2. The ratio of the mobility to electron recombination rate was determined from photoconductivity measurements to be 6.20(108) 1/(V-cm). The analysis permits determination of the oxygen partial pressure and temperature necessary to control the Cu valence states and hence photorefractive properties of the KTN sample. It is thus possible to vary and control the magnitude and response time for a given application.
Original language | English |
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Pages | 259-260 |
Number of pages | 2 |
State | Published - 1990 |
Externally published | Yes |
Event | First International Meeting on Nonlinear Optics: Materials, Phenomena and Devices - NLO '90 - Kauai, HI, USA Duration: 16 Jul 1990 → 20 Jul 1990 |
Conference
Conference | First International Meeting on Nonlinear Optics: Materials, Phenomena and Devices - NLO '90 |
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City | Kauai, HI, USA |
Period | 16/07/90 → 20/07/90 |