IVa-2 Determination of Surface State Capture Cross Section from Transfer Loss Measurements in CCD's

R. J. Kriegler, J. Shappir, T. F. Devenyi

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Original language	English
Pages (from-to)	1206-1207
Number of pages	2
Journal	IEEE Transactions on Electron Devices
Volume	24
Issue number	9
DOIs	https://doi.org/10.1109/T-ED.1977.18950
State	Published - Sep 1977
Externally published	Yes

Access to Document

@article{5de8e4784d014c8589ffdeb5fc3d6e3e,

title = "IVa-2 Determination of Surface State Capture Cross Section from Transfer Loss Measurements in CCD's",

author = "Kriegler, {R. J.} and J. Shappir and Devenyi, {T. F.}",

year = "1977",

month = sep,

doi = "10.1109/T-ED.1977.18950",

language = "אנגלית",

volume = "24",

pages = "1206--1207",

journal = "IEEE Transactions on Electron Devices",

issn = "0018-9383",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "9",

}

TY - JOUR

T1 - IVa-2 Determination of Surface State Capture Cross Section from Transfer Loss Measurements in CCD's

AU - Kriegler, R. J.

AU - Shappir, J.

AU - Devenyi, T. F.

PY - 1977/9

Y1 - 1977/9

UR - http://www.scopus.com/inward/record.url?scp=84939768475&partnerID=8YFLogxK

U2 - 10.1109/T-ED.1977.18950

DO - 10.1109/T-ED.1977.18950

M3 - ???researchoutput.researchoutputtypes.contributiontojournal.article???

AN - SCOPUS:84939768475

SN - 0018-9383

VL - 24

SP - 1206

EP - 1207

JO - IEEE Transactions on Electron Devices

JF - IEEE Transactions on Electron Devices

IS - 9

ER -