IVB-3 Dynamic Trapping-Detrapping Phenomena in Thermal SiO2

Y. Nissan-Cohen, J. Shappir, D. Frohman-Bentchkowsky

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)2542-2543
Number of pages2
JournalIEEE Transactions on Electron Devices
Volume32
Issue number11
DOIs
StatePublished - Nov 1985

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