Original language | English |
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Pages (from-to) | 2542-2543 |
Number of pages | 2 |
Journal | IEEE Transactions on Electron Devices |
Volume | 32 |
Issue number | 11 |
DOIs | |
State | Published - Nov 1985 |
IVB-3 Dynamic Trapping-Detrapping Phenomena in Thermal SiO2
Y. Nissan-Cohen, J. Shappir, D. Frohman-Bentchkowsky
Research output: Contribution to journal › Article › peer-review