Laboratory test of a LSM-based narrow bandpass and high throughput camera for Tokamak plasma imaging between 100 and 200 Å

L. K. Huang*, S. P. Regan, M. Finkenthal, H. W. Moos

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

A narrow-bandpass (∼7 Å) and high-throughput (f/5.5) extreme ultraviolet (XUV) camera using layered synthetic microstructure (LSM) coated optics has been built and tested at the Johns Hopkins University laboratory in order to image tokamak plasma emission between 100 and 200 Å. The LSM camera was tested with a Penning ionization discharge emission source. The test measures the spectral bandpass, the spatial resolution, and the relative photosensitivities. The XUV camera will be used to measure the O vi 150 Å line brightness on the Phaedrus-T tokamak with a tangential view to investigate the impurity transport.

Original languageEnglish
Pages (from-to)5171-5173
Number of pages3
JournalReview of Scientific Instruments
Volume63
Issue number10
DOIs
StatePublished - 1992
Externally publishedYes

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