Layered interval codes for TCAM-based classification

Anat Bremler-Barr; David Hay; Boris Farber; Danny Hendler

doi:10.1145/1375457.1375513

Layered interval codes for TCAM-based classification

Anat Bremler-Barr^*, David Hay, Boris Farber, Danny Hendler

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

5 Scopus citations

Original language	English
Title of host publication	SIGMETRICS'08
Subtitle of host publication	Proceedings of the 2008 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems
Pages	445-446
Number of pages	2
Edition	1 SPECIAL ISSUE
DOIs	https://doi.org/10.1145/1375457.1375513
State	Published - 2008
Externally published	Yes
Event	2008 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS'08 - Annapolis, MD, United States Duration: 2 Jun 2008 → 6 Jun 2008

Publication series

Name	SIGMETRICS'08: Proceedings of the 2008 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems
Number	1 SPECIAL ISSUE
Volume	36

Conference

Conference	2008 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS'08
Country/Territory	United States
City	Annapolis, MD
Period	2/06/08 → 6/06/08

Keywords

Classification
TCAM

Access to Document

10.1145/1375457.1375513

Cite this

Bremler-Barr, A., Hay, D., Farber, B., & Hendler, D. (2008). Layered interval codes for TCAM-based classification. In SIGMETRICS'08: Proceedings of the 2008 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems (1 SPECIAL ISSUE ed., pp. 445-446). (SIGMETRICS'08: Proceedings of the 2008 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems; Vol. 36, No. 1 SPECIAL ISSUE). https://doi.org/10.1145/1375457.1375513

Bremler-Barr, Anat ; Hay, David ; Farber, Boris et al. / Layered interval codes for TCAM-based classification. SIGMETRICS'08: Proceedings of the 2008 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems. 1 SPECIAL ISSUE. ed. 2008. pp. 445-446 (SIGMETRICS'08: Proceedings of the 2008 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems; 1 SPECIAL ISSUE).

@inproceedings{45e918b588544e2c813e972015e39af8,

title = "Layered interval codes for TCAM-based classification",

keywords = "Classification, TCAM",

author = "Anat Bremler-Barr and David Hay and Boris Farber and Danny Hendler",

year = "2008",

doi = "10.1145/1375457.1375513",

language = "אנגלית",

isbn = "9781605580050",

series = "SIGMETRICS'08: Proceedings of the 2008 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems",

number = "1 SPECIAL ISSUE",

pages = "445--446",

booktitle = "SIGMETRICS'08",

edition = "1 SPECIAL ISSUE",

note = "2008 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS'08 ; Conference date: 02-06-2008 Through 06-06-2008",

}

Bremler-Barr, A, Hay, D, Farber, B & Hendler, D 2008, Layered interval codes for TCAM-based classification. in SIGMETRICS'08: Proceedings of the 2008 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems. 1 SPECIAL ISSUE edn, SIGMETRICS'08: Proceedings of the 2008 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, no. 1 SPECIAL ISSUE, vol. 36, pp. 445-446, 2008 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS'08, Annapolis, MD, United States, 2/06/08. https://doi.org/10.1145/1375457.1375513

Layered interval codes for TCAM-based classification. / Bremler-Barr, Anat; Hay, David; Farber, Boris et al.
SIGMETRICS'08: Proceedings of the 2008 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems. 1 SPECIAL ISSUE. ed. 2008. p. 445-446 (SIGMETRICS'08: Proceedings of the 2008 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems; Vol. 36, No. 1 SPECIAL ISSUE).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Bremler-Barr, Anat

AU - Hay, David

AU - Farber, Boris

AU - Hendler, Danny

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BT - SIGMETRICS'08

T2 - 2008 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS'08

Y2 - 2 June 2008 through 6 June 2008

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Bremler-Barr A, Hay D, Farber B, Hendler D. Layered interval codes for TCAM-based classification. In SIGMETRICS'08: Proceedings of the 2008 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems. 1 SPECIAL ISSUE ed. 2008. p. 445-446. (SIGMETRICS'08: Proceedings of the 2008 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems; 1 SPECIAL ISSUE). doi: 10.1145/1375457.1375513

Layered interval codes for TCAM-based classification

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Conference

Keywords

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