Layered interval codes for TCAM-based classification

Anat Bremler-Barr*, David Hay, Boris Farber, Danny Hendler

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations
Original languageAmerican English
Title of host publicationSIGMETRICS'08
Subtitle of host publicationProceedings of the 2008 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems
Pages445-446
Number of pages2
Edition1 SPECIAL ISSUE
DOIs
StatePublished - 2008
Externally publishedYes
Event2008 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS'08 - Annapolis, MD, United States
Duration: 2 Jun 20086 Jun 2008

Publication series

NameSIGMETRICS'08: Proceedings of the 2008 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems
Number1 SPECIAL ISSUE
Volume36

Conference

Conference2008 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS'08
Country/TerritoryUnited States
CityAnnapolis, MD
Period2/06/086/06/08

Keywords

  • Classification
  • TCAM

Cite this