Lifetime and coherence of two-level defects in a Josephson junction

Yoni Shalibo*, Ya'Ara Rofe, David Shwa, Felix Zeides, Matthew Neeley, John M. Martinis, Nadav Katz

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

78 Scopus citations

Abstract

We measure the lifetime (T1) and coherence (T2) of two-level defect states (TLSs) in the insulating barrier of a Josephson phase qubit and compare to the interaction strength between the two systems. We find for the average decay times a power-law dependence on the corresponding interaction strengths, whereas for the average coherence times we find an optimum at intermediate coupling strengths. We explain both the lifetime and the coherence results using the standard TLS model, including dipole radiation by phonons and anticorrelated dependence of the energy parameters on environmental fluctuations.

Original languageAmerican English
Article number177001
JournalPhysical Review Letters
Volume105
Issue number17
DOIs
StatePublished - 19 Oct 2010

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