Lifetime measurements in an electrostatic ion beam trap using image charge monitoring

Igor Rahinov*, Yoni Toker, Oded Heber, Daniel Strasser, Michael Rappaport, Dirk Schwalm, Daniel Zajfman

*Corresponding author for this work

Research output: Contribution to journalReview articlepeer-review

16 Scopus citations

Abstract

A technique for mass-selective lifetime measurements of keV ions in a linear electrostatic ion beam trap is presented. The technique is based on bunching the ions using a weak RF potential and non-destructive ion detection by a pick-up electrode. This method has no mass-limitation, possesses the advantage of inherent mass-selectivity, and offers a possibility of measuring simultaneously the lifetimes of different ion species with no need for prior mass-selection.

Original languageAmerican English
Article number033302
JournalReview of Scientific Instruments
Volume83
Issue number3
DOIs
StatePublished - Mar 2012

Bibliographical note

Funding Information:
This work was supported by the Israel Science Foundation (Grant No. 1242/09) and by Research Grant from Estate of David Turner and by YEDA in collaboration with ABSciex. D. Sch. acknowledges support by the Weizmann Institute of Science through the Joseph Meyerhoff program. D. St. acknowledges support from the European Community's Seventh Framework Programme (FP7/2007-2013) under grant agreement No. 247471.

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