Measurement of electric-field noise from interchangeable samples with a trapped-ion sensor

Kyle S. McKay; Dustin A. Hite; Philip D. Kent; Shlomi Kotler; Dietrich Leibfried; Daniel H. Slichter; Andrew C. Wilson; David P. Pappas

doi:10.1103/PhysRevA.104.052610

Measurement of electric-field noise from interchangeable samples with a trapped-ion sensor

Kyle S. McKay, Dustin A. Hite^*, Philip D. Kent, Shlomi Kotler, Dietrich Leibfried, Daniel H. Slichter, Andrew C. Wilson, David P. Pappas

^*Corresponding author for this work

Department of Applied Physics

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

We demonstrate the use of a single trapped ion as a sensor to probe electric-field noise from interchangeable test surfaces. As proof of principle, we measure the magnitude and distance dependence of electric-field noise from two ion-trap-like samples with patterned Au electrodes. This trapped-ion sensor could be combined with other surface characterization tools to help elucidate the mechanisms that give rise to electric-field noise from ion-trap surfaces. Such noise presents a significant hurdle for performing large-scale trapped-ion quantum computations.

Original language	American English
Article number	A23
Journal	Physical Review A
Volume	104
Issue number	5
DOIs	https://doi.org/10.1103/PhysRevA.104.052610
State	Published - 18 Nov 2021

Bibliographical note

Funding Information:
The authors acknowledge helpful discussions with S. Glancy and E. Knill and thank M. Kim, A. McFadden, and R. Goldfarb for helpful comments on the article. K.S.M. and P.D.K acknowledge support as associates in the Professional Research Experience Program (PREP) operated jointly by NIST and the University of Colorado Boulder under Award No. 70NANB18H006 from the U.S. Department of Commerce, NIST. Contributions to this article by workers at NIST, an agency of the U.S. Government, are not subject to U.S. copyright.

Publisher Copyright:
© 2021 American Physical Society. US.

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title = "Measurement of electric-field noise from interchangeable samples with a trapped-ion sensor",

abstract = "We demonstrate the use of a single trapped ion as a sensor to probe electric-field noise from interchangeable test surfaces. As proof of principle, we measure the magnitude and distance dependence of electric-field noise from two ion-trap-like samples with patterned Au electrodes. This trapped-ion sensor could be combined with other surface characterization tools to help elucidate the mechanisms that give rise to electric-field noise from ion-trap surfaces. Such noise presents a significant hurdle for performing large-scale trapped-ion quantum computations.",

author = "McKay, {Kyle S.} and Hite, {Dustin A.} and Kent, {Philip D.} and Shlomi Kotler and Dietrich Leibfried and Slichter, {Daniel H.} and Wilson, {Andrew C.} and Pappas, {David P.}",

note = "Funding Information: The authors acknowledge helpful discussions with S. Glancy and E. Knill and thank M. Kim, A. McFadden, and R. Goldfarb for helpful comments on the article. K.S.M. and P.D.K acknowledge support as associates in the Professional Research Experience Program (PREP) operated jointly by NIST and the University of Colorado Boulder under Award No. 70NANB18H006 from the U.S. Department of Commerce, NIST. Contributions to this article by workers at NIST, an agency of the U.S. Government, are not subject to U.S. copyright. Publisher Copyright: {\textcopyright} 2021 American Physical Society. US.",

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doi = "10.1103/PhysRevA.104.052610",

language = "American English",

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AU - Hite, Dustin A.

AU - Kent, Philip D.

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AU - Leibfried, Dietrich

AU - Slichter, Daniel H.

AU - Wilson, Andrew C.

AU - Pappas, David P.

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PY - 2021/11/18

Y1 - 2021/11/18

N2 - We demonstrate the use of a single trapped ion as a sensor to probe electric-field noise from interchangeable test surfaces. As proof of principle, we measure the magnitude and distance dependence of electric-field noise from two ion-trap-like samples with patterned Au electrodes. This trapped-ion sensor could be combined with other surface characterization tools to help elucidate the mechanisms that give rise to electric-field noise from ion-trap surfaces. Such noise presents a significant hurdle for performing large-scale trapped-ion quantum computations.

AB - We demonstrate the use of a single trapped ion as a sensor to probe electric-field noise from interchangeable test surfaces. As proof of principle, we measure the magnitude and distance dependence of electric-field noise from two ion-trap-like samples with patterned Au electrodes. This trapped-ion sensor could be combined with other surface characterization tools to help elucidate the mechanisms that give rise to electric-field noise from ion-trap surfaces. Such noise presents a significant hurdle for performing large-scale trapped-ion quantum computations.

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U2 - 10.1103/PhysRevA.104.052610

DO - 10.1103/PhysRevA.104.052610

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JO - Physical Review A

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Measurement of electric-field noise from interchangeable samples with a trapped-ion sensor

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