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Measurement of electric-field noise from interchangeable samples with a trapped-ion sensor
Kyle S. McKay, Dustin A. Hite*, Philip D. Kent, Shlomi Kotler, Dietrich Leibfried, Daniel H. Slichter, Andrew C. Wilson, David P. Pappas
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
5
Scopus
citations