Abstract
The half-life of Si32 has been measured to be T12=101±18 yr, considerably shorter than the previously accepted value of 300 yr. The new value was obtained by measuring the specific β activity with a liquid-scintillation-counter technique and the Si32 concentration with tandem-accelerator mass spectrometry. It is expected that the present result will have a strong impact on studies with cosmogenic Si32.
Original language | English |
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Pages (from-to) | 592-596 |
Number of pages | 5 |
Journal | Physical Review Letters |
Volume | 45 |
Issue number | 8 |
DOIs | |
State | Published - 1980 |