Measurement of the Si32 half-life via accelerator mass spectrometry

W. Kutschera*, W. Henning, M. Paul, R. K. Smither, E. J. Stephenson, J. L. Yntema, D. E. Alburger, J. B. Cumming, G. Harbottle

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

62 Scopus citations

Abstract

The half-life of Si32 has been measured to be T12=101±18 yr, considerably shorter than the previously accepted value of 300 yr. The new value was obtained by measuring the specific β activity with a liquid-scintillation-counter technique and the Si32 concentration with tandem-accelerator mass spectrometry. It is expected that the present result will have a strong impact on studies with cosmogenic Si32.

Original languageEnglish
Pages (from-to)592-596
Number of pages5
JournalPhysical Review Letters
Volume45
Issue number8
DOIs
StatePublished - 1980

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