TY - JOUR
T1 - Measurement of the x-ray diffraction phase in a 2d crystal
AU - Baltes, H.
AU - Yacoby, Y.
AU - Pindak, R.
AU - Clarke, R.
AU - Pfeiffer, L.
AU - Berman, L.
PY - 1997/1/1
Y1 - 1997/1/1
N2 - We report the determination of the x-ray diffraction phase in 2D crystals, systems which are periodic in two dimensions and aperiodic in the third. The method consists of measuring the intensity of pairs of parallel, coherent diffracted beams, generated by an incident beam and a beam reflected from a gold mirror layer evaporated on the 2D crystal. Our experiments on an epitaxial GaAs/AlAs heterostructure with aperiodic layering demonstrate that it is possible to measure the phase. This opens the way for direct structural studies of a wide variety of 2D crystals.
AB - We report the determination of the x-ray diffraction phase in 2D crystals, systems which are periodic in two dimensions and aperiodic in the third. The method consists of measuring the intensity of pairs of parallel, coherent diffracted beams, generated by an incident beam and a beam reflected from a gold mirror layer evaporated on the 2D crystal. Our experiments on an epitaxial GaAs/AlAs heterostructure with aperiodic layering demonstrate that it is possible to measure the phase. This opens the way for direct structural studies of a wide variety of 2D crystals.
UR - http://www.scopus.com/inward/record.url?scp=0001060996&partnerID=8YFLogxK
U2 - 10.1103/PhysRevLett.79.1285
DO - 10.1103/PhysRevLett.79.1285
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AN - SCOPUS:0001060996
SN - 0031-9007
VL - 79
SP - 1285
EP - 1288
JO - Physical Review Letters
JF - Physical Review Letters
IS - 7
ER -