Meeting reliability requirements for 300-mm CMP manufacturing using integrated metrology

Hirofumi Seo*, Ori Braitbart

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Scopus citations
Original languageEnglish
Pages (from-to)45
Number of pages1
JournalMICRO
Volume24
Issue number6
StatePublished - 2006
Externally publishedYes

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