Metamaterials for "free space on a chip" applications

Uriel Levy*, Maxim Abashin, Kazuhiro Ikeda, Yeshaiahu Fainman

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We present our recent progress on the design, fabrication and characterization of metamaterials that can be used as basic building blocks for "free space on a chip" nanophotonic system integration. These devices are realized by fabricating nanostructures with space variant duty cycle on Silicon on insulator (SOI) material platform. The devices are characterized with Heterodyne Nearfield Scanning Optical Microscope that allows a direct measurement of both amplitude and phase of the near field. Using the described concept, we show specific examples of light bending, focusing and splitting. A design for mode matching between two different waveguides is also shown.

Original languageEnglish
Title of host publicationAdvanced Fabrication Technologies for Micro/Nano Optics and Photonics
DOIs
StatePublished - 2008
EventAdvanced Fabrication Technologies for Micro/Nano Optics and Photonics - San Jose, CA, United States
Duration: 21 Jan 200823 Jan 2008

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6883
ISSN (Print)0277-786X

Conference

ConferenceAdvanced Fabrication Technologies for Micro/Nano Optics and Photonics
Country/TerritoryUnited States
CitySan Jose, CA
Period21/01/0823/01/08

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