Microwave near-field polarimetry

A. F. Lann; M. Golosovsky; D. Davidov; A. Frenkel

doi:10.1063/1.124454

Microwave near-field polarimetry

A. F. Lann^*
, M. Golosovsky
, D. Davidov
, A. Frenkel

^*Corresponding author for this work

Racah Institute of Physics

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

A near-field probe is applied to perform microwave polarimetric measurements with a subwavelength spatial resolution. The probe is a symmetrical cross-slit antenna formed by two very thin orthogonal slits at the end of a circular waveguide. The mapping is phase-sensitive and can be done with a subwavelength spatial resolution of at least λ/16 in conductors. The probe may also be used for local measurement of Hall mobility in semiconductors.

Original language	English
Pages (from-to)	603-605
Number of pages	3
Journal	Applied Physics Letters
Volume	75
Issue number	5
DOIs	https://doi.org/10.1063/1.124454
State	Published - 2 Aug 1999

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10.1063/1.124454

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title = "Microwave near-field polarimetry",

abstract = "A near-field probe is applied to perform microwave polarimetric measurements with a subwavelength spatial resolution. The probe is a symmetrical cross-slit antenna formed by two very thin orthogonal slits at the end of a circular waveguide. The mapping is phase-sensitive and can be done with a subwavelength spatial resolution of at least λ/16 in conductors. The probe may also be used for local measurement of Hall mobility in semiconductors.",

author = "Lann, \{A. F.\} and M. Golosovsky and D. Davidov and A. Frenkel",

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Microwave near-field polarimetry

Abstract

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