Microwave studies of thin manganite films on SrTiO 3 substrate

M. Golosovsky; M. Abu-Teir; D. Davidov; O. Arnache; P. Monod; N. Bontemps; R. C. Budhani

doi:10.1063/1.2089162

Microwave studies of thin manganite films on SrTiO ₃ substrate

M. Golosovsky^*, M. Abu-Teir, D. Davidov, O. Arnache, P. Monod, N. Bontemps, R. C. Budhani

^*Corresponding author for this work

Racah Institute of Physics

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

We report phase-sensitive microwave studies of thin epitaxial manganite La1-x Srx Mn O3 films on SrTi O3 substrate. The measurements were performed in the temperature range of 80-330 K using a contactless microwave scanning probe operating at 26 GHz with the aim of comparing dc resistivity and microwave resistivity. We find that the dc and the microwave resistivity of the La0.8 Sr0.2 Mn O3 are almost the same, while for the La0.7 Sr0.3 Mn O3 they are different above 200 K. Our analysis of different mechanisms of this discrepancy, together with our measurement of the ferromagnetic resonance on the same samples, yields the film inhomogeneity on the microscopic scale as the most probable explanation.

Original language	English
Article number	084902
Journal	Journal of Applied Physics
Volume	98
Issue number	8
DOIs	https://doi.org/10.1063/1.2089162
State	Published - 15 Oct 2005

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title = "Microwave studies of thin manganite films on SrTiO 3 substrate",

abstract = "We report phase-sensitive microwave studies of thin epitaxial manganite La1-x Srx Mn O3 films on SrTi O3 substrate. The measurements were performed in the temperature range of 80-330 K using a contactless microwave scanning probe operating at 26 GHz with the aim of comparing dc resistivity and microwave resistivity. We find that the dc and the microwave resistivity of the La0.8 Sr0.2 Mn O3 are almost the same, while for the La0.7 Sr0.3 Mn O3 they are different above 200 K. Our analysis of different mechanisms of this discrepancy, together with our measurement of the ferromagnetic resonance on the same samples, yields the film inhomogeneity on the microscopic scale as the most probable explanation.",

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AU - Golosovsky, M.

AU - Abu-Teir, M.

AU - Davidov, D.

AU - Arnache, O.

AU - Monod, P.

AU - Bontemps, N.

AU - Budhani, R. C.

PY - 2005/10/15

Y1 - 2005/10/15

N2 - We report phase-sensitive microwave studies of thin epitaxial manganite La1-x Srx Mn O3 films on SrTi O3 substrate. The measurements were performed in the temperature range of 80-330 K using a contactless microwave scanning probe operating at 26 GHz with the aim of comparing dc resistivity and microwave resistivity. We find that the dc and the microwave resistivity of the La0.8 Sr0.2 Mn O3 are almost the same, while for the La0.7 Sr0.3 Mn O3 they are different above 200 K. Our analysis of different mechanisms of this discrepancy, together with our measurement of the ferromagnetic resonance on the same samples, yields the film inhomogeneity on the microscopic scale as the most probable explanation.

AB - We report phase-sensitive microwave studies of thin epitaxial manganite La1-x Srx Mn O3 films on SrTi O3 substrate. The measurements were performed in the temperature range of 80-330 K using a contactless microwave scanning probe operating at 26 GHz with the aim of comparing dc resistivity and microwave resistivity. We find that the dc and the microwave resistivity of the La0.8 Sr0.2 Mn O3 are almost the same, while for the La0.7 Sr0.3 Mn O3 they are different above 200 K. Our analysis of different mechanisms of this discrepancy, together with our measurement of the ferromagnetic resonance on the same samples, yields the film inhomogeneity on the microscopic scale as the most probable explanation.

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Microwave studies of thin manganite films on SrTiO ₃ substrate

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