Abstract
A near-field mm-wave scanning microscope was used to image the resistivity of different materials. This technique uses a resonant slit antenna as a scanning probe which is scanned over the surface under study while the reflection/transmission from the surface is measured. The spatial resolution of the near-field imaging is not limited by the wavelength and may be less than a micron, however, calculation of the field distribution in the near-field imaging is difficult which makes it less quantitative than the far-field imaging. Therefore, the spatial resolution and the contrast in the near-field imaging strongly depend on the probe-sample separation.
| Original language | English |
|---|---|
| Pages (from-to) | 1333-1334 |
| Number of pages | 2 |
| Journal | IEEE MTT-S International Microwave Symposium Digest |
| Volume | 3 |
| State | Published - 1997 |
| Event | Proceedings of the 1997 IEEE MTT-S International Microwave Symposium. Part 1 (of 3) - Denver, CO, USA Duration: 8 Jun 1997 → 13 Jun 1997 |