Mobility-lifetime products in glow discharge and rf sputter deposited a-Si:H

M. H. Farias, A. Roche, S. Z. Weisz, H. Jia, J. Shinar, Y. Lubianiker, I. Bałberg

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

A comparative study of the deposition temperature (Ts) dependence of the mobility-lifetime (μτ) products of the charge carriers in glow-discharge and rf sputter-deposited a-Si:H is described and discussed. The Ts-dcpendence of the μτ's and the majority carrier light-intensity exponents of the two types of films are strikingly similar. These observations lead to the conclusion that the structure of the recombination levels as well as the recombination processes are in accord with the "defect pool" model, in contrast to previous suggestions. The differences between the two types of films thus appear to be limited to the differences in the concentrations of dangling bonds.

Original languageEnglish
Title of host publicationAmorphous Silicon Technology - 1994
PublisherMaterials Research Society
Pages425-430
Number of pages6
ISBN (Print)1558992367, 9781558992368
DOIs
StatePublished - 1994
Event1994 MRS Spring Meeting - San Francisco, CA, United States
Duration: 4 Apr 19948 Apr 1994

Publication series

NameMaterials Research Society Symposium Proceedings
Volume336
ISSN (Print)0272-9172

Conference

Conference1994 MRS Spring Meeting
Country/TerritoryUnited States
CitySan Francisco, CA
Period4/04/948/04/94

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