Multiple Resolution Texture Analysis and Classification

Shmuel Peleg; Joseph Naor; Ralph Hartley; David Avnir

doi:10.1109/TPAMI.1984.4767557

Multiple Resolution Texture Analysis and Classification

Shmuel Peleg
, Joseph Naor
, Ralph Hartley
, David Avnir

Research output: Contribution to journal › Article › peer-review

736 Scopus citations

Abstract

Textures are classified based on the change in their properties with changing resolution. The area of the gray level surface is mea- sured at serveral resolutions. This area decreases at coarser resolutions since fine details that contribute to the area disappear. Fractal properties of the picture are computed from the rate of this decrease in area, and are used for texture comparison and classification. The relation of a texture picture to its negative, and directional properties, are also discussed.

Original language	English
Pages (from-to)	518-523
Number of pages	6
Journal	IEEE Transactions on Pattern Analysis and Machine Intelligence
Volume	PAMI-6
Issue number	4
DOIs	https://doi.org/10.1109/TPAMI.1984.4767557
State	Published - Jul 1984

Keywords

Fractals
fractal signature
multiresolution methods
texture classification

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10.1109/TPAMI.1984.4767557

Cite this

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AU - Avnir, David

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KW - fractal signature

KW - multiresolution methods

KW - texture classification

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Multiple Resolution Texture Analysis and Classification

Abstract

Keywords

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