Original language | English |
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Pages (from-to) | 1572-1573 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 18 |
DOIs | |
State | Published - Jul 2012 |
Multiprobe AFM Electrical Characterization and Tip Enhanced Raman Spectroscopy of Graphene on Silicon/Silicon Oxide Substrates
Hesham Taha, Rimma Dekhter, Yossi Bar-David, Galina Fish, Aaron Lewis
Research output: Contribution to journal › Article › peer-review
1
Scopus
citations