Multiprobe AFM Electrical Characterization and Tip Enhanced Raman Spectroscopy of Graphene on Silicon/Silicon Oxide Substrates

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Original language	English
Pages (from-to)	1572-1573
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	18
DOIs	https://doi.org/10.1017/S1431927612009713
State	Published - Jul 2012

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title = "Multiprobe AFM Electrical Characterization and Tip Enhanced Raman Spectroscopy of Graphene on Silicon/Silicon Oxide Substrates",

author = "Hesham Taha and Rimma Dekhter and Yossi Bar-David and Galina Fish and Aaron Lewis",

year = "2012",

month = jul,

doi = "10.1017/S1431927612009713",

language = "אנגלית",

volume = "18",

pages = "1572--1573",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

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T1 - Multiprobe AFM Electrical Characterization and Tip Enhanced Raman Spectroscopy of Graphene on Silicon/Silicon Oxide Substrates

AU - Taha, Hesham

AU - Dekhter, Rimma

AU - Bar-David, Yossi

AU - Fish, Galina

AU - Lewis, Aaron

PY - 2012/7

Y1 - 2012/7

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AN - SCOPUS:85007997411

SN - 1431-9276

VL - 18

SP - 1572

EP - 1573

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

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