TY - JOUR
T1 - Nano-sized SQUID-on-tip for scanning probe microscopy
AU - Finkler, A.
AU - Vasyukov, D.
AU - Segev, Y.
AU - Neeman, L.
AU - Anahory, Y.
AU - Myasoedov, Y.
AU - Rappaport, M. L.
AU - Huber, M. E.
AU - Martin, J.
AU - Yacoby, A.
AU - Zeldov, E.
PY - 2012
Y1 - 2012
N2 - We present a SQUID of novel design, which is fabricated on the tip of a pulled quartz tube in a simple 3-step evaporation process without need for any additional processing, patterning, or lithography. The resulting devices have SQUID loops with typical diameters in the range 75-300 nm. They operate in magnetic fields up to 0.6 T and have flux sensitivity of 1.8 μΦ0/Hz1/2 and magnetic field sensitivity of 10 -7 T/Hz1/2, which corresponds to a spin sensitivity of 65 μB/Hz1/2 for aluminum SQUIDs. The shape of the tip and the small area of the SQUID loop, together with its high sensitivity, make our device an excellent tool for scanning SQUID microscopy: With the SQUID-on-tip glued to a tine of a quartz tuning fork, we have succeeded in obtaining magnetic images of a patterned niobium film and of vortices in a superconducting film in a magnetic field.
AB - We present a SQUID of novel design, which is fabricated on the tip of a pulled quartz tube in a simple 3-step evaporation process without need for any additional processing, patterning, or lithography. The resulting devices have SQUID loops with typical diameters in the range 75-300 nm. They operate in magnetic fields up to 0.6 T and have flux sensitivity of 1.8 μΦ0/Hz1/2 and magnetic field sensitivity of 10 -7 T/Hz1/2, which corresponds to a spin sensitivity of 65 μB/Hz1/2 for aluminum SQUIDs. The shape of the tip and the small area of the SQUID loop, together with its high sensitivity, make our device an excellent tool for scanning SQUID microscopy: With the SQUID-on-tip glued to a tine of a quartz tuning fork, we have succeeded in obtaining magnetic images of a patterned niobium film and of vortices in a superconducting film in a magnetic field.
UR - http://www.scopus.com/inward/record.url?scp=84873654994&partnerID=8YFLogxK
U2 - 10.1088/1742-6596/400/5/052004
DO - 10.1088/1742-6596/400/5/052004
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AN - SCOPUS:84873654994
SN - 1742-6588
VL - 400
JO - Journal of Physics: Conference Series
JF - Journal of Physics: Conference Series
IS - PART 4
M1 - 052004
T2 - 26th International Conference on Low Temperature Physics, LT 2011
Y2 - 10 August 2011 through 17 August 2011
ER -