Nanometer-scale electronic and microstructural properties of grain boundaries in Cu(In,Ga)Se2

S. Sadewasser*, D. Abou-Ras, D. Azulay, R. Baier, I. Balberg, D. Cahen, S. Cohen, K. Gartsman, K. Ganesan, J. Kavalakkatt, W. Li, O. Millo, Th Rissom, Y. Rosenwaks, H. W. Schock, A. Schwarzman, T. Unold

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

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Chemistry

Engineering

Material Science

Physics