Nanoscale mapping of strain and composition in quantum dots using Kelvin probe force microscopy

S. Shusterman, A. Raizman, A. Sher, Y. Parltiel*, A. Schwarzman, E. Lepkifker, Y. Rosenwaks

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

31 Scopus citations

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Material Science