Near-field of a scanning aperture microwave probe: A 3-D finite element analysis

Michael Golosovsky; Eldad Maniv; Dan Davidov; Avraham Frenkel

doi:10.1109/TIM.2002.806006

Near-field of a scanning aperture microwave probe: A 3-D finite element analysis

Michael Golosovsky^*, Eldad Maniv, Dan Davidov, Avraham Frenkel

^*Corresponding author for this work

Racah Institute of Physics

Research output: Contribution to journal › Article › peer-review

23 Scopus citations

Abstract

We calculate the field distribution in the near-field zone of a scanning aperture microwave probe using the ANSOFT/HFSS full three-dimensional (3-D) finite element software. The probe is a narrow resonant slot in the endwall of a rectangular metallic waveguide. We find a sharp collimation of the electric field outside the slot and a strong increase of the electric field magnitude at the aperture plane. We compare numerical results to the two-dimensional-quasistatic model which assumes a narrow and infinitely long slot in a conducting screen. This model satisfactorily describes spatial characteristics of the field distribution only at the distances less than the slot width (proximity zone), while to find the field in the whole near-field zone, full 3-D wave analysis is required.

Original language	English
Pages (from-to)	1090-1096
Number of pages	7
Journal	IEEE Transactions on Instrumentation and Measurement
Volume	51
Issue number	5
DOIs	https://doi.org/10.1109/TIM.2002.806006
State	Published - Oct 2002

Keywords

FEM
Field distribution
Near-field
Scanning microwave probe
Slot

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10.1109/TIM.2002.806006

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title = "Near-field of a scanning aperture microwave probe: A 3-D finite element analysis",

abstract = "We calculate the field distribution in the near-field zone of a scanning aperture microwave probe using the ANSOFT/HFSS full three-dimensional (3-D) finite element software. The probe is a narrow resonant slot in the endwall of a rectangular metallic waveguide. We find a sharp collimation of the electric field outside the slot and a strong increase of the electric field magnitude at the aperture plane. We compare numerical results to the two-dimensional-quasistatic model which assumes a narrow and infinitely long slot in a conducting screen. This model satisfactorily describes spatial characteristics of the field distribution only at the distances less than the slot width (proximity zone), while to find the field in the whole near-field zone, full 3-D wave analysis is required.",

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author = "Michael Golosovsky and Eldad Maniv and Dan Davidov and Avraham Frenkel",

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T1 - Near-field of a scanning aperture microwave probe

T2 - A 3-D finite element analysis

AU - Golosovsky, Michael

AU - Maniv, Eldad

AU - Davidov, Dan

AU - Frenkel, Avraham

PY - 2002/10

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N2 - We calculate the field distribution in the near-field zone of a scanning aperture microwave probe using the ANSOFT/HFSS full three-dimensional (3-D) finite element software. The probe is a narrow resonant slot in the endwall of a rectangular metallic waveguide. We find a sharp collimation of the electric field outside the slot and a strong increase of the electric field magnitude at the aperture plane. We compare numerical results to the two-dimensional-quasistatic model which assumes a narrow and infinitely long slot in a conducting screen. This model satisfactorily describes spatial characteristics of the field distribution only at the distances less than the slot width (proximity zone), while to find the field in the whole near-field zone, full 3-D wave analysis is required.

AB - We calculate the field distribution in the near-field zone of a scanning aperture microwave probe using the ANSOFT/HFSS full three-dimensional (3-D) finite element software. The probe is a narrow resonant slot in the endwall of a rectangular metallic waveguide. We find a sharp collimation of the electric field outside the slot and a strong increase of the electric field magnitude at the aperture plane. We compare numerical results to the two-dimensional-quasistatic model which assumes a narrow and infinitely long slot in a conducting screen. This model satisfactorily describes spatial characteristics of the field distribution only at the distances less than the slot width (proximity zone), while to find the field in the whole near-field zone, full 3-D wave analysis is required.

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Near-field of a scanning aperture microwave probe: A 3-D finite element analysis

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Keywords

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