Near-field optical and atomic force constraints for super-resolution 3D deconvolution in far-field optical microscopy

Noel Axelrod*, Anna Radko, Nissim Ben-Yosef, Aaron Khatchatouriants, Millet Treinin, Aaron Lewis

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

2 Scopus citations

Abstract

We demonstrate that near-field optical and atomic force microscopy data can be used for super-resolution three-dimensional (3-D) image restoration in optical sectioning fluorescence microscopy. A crucial feature in this approach is the full integration of such data sets with digital far-field images. The scanned probe data is used to provide modalities for boundary constraints which define surface optical information and spatial domains of optical alterations in a sample with a spatial precision that has been unachievable in the past. A restoration algorithm that can use such a complex of data for 3-D image deconvolution is presented. It uses a Tikhonov-Miller regularization scheme and allows for the imposition of different types of constraints to obtain super-resolution deconvolved images. Performance was tested by using simulated 3-D imaging. An example is given of the restoration of a 3-D wide field optical image of a biological specimen in the presence of atomic force constraints.

Original languageAmerican English
Pages (from-to)161-171
Number of pages11
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3919
StatePublished - 2000
EventThree-Dimensional and Multidimensional Microscopy: Image Acquisition Processing VII - San Jose, CA, USA
Duration: 23 Jan 200024 Jan 2000

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