@inproceedings{a4f90c52cd5b41c6b793ce14402fbedd,
title = "Near field optical measurements of silicon waveguide in Mid-IR regime using scanning thermal microscopy",
abstract = "We observe for the first time the near field optical intensity distribution of silicon nanophotonic devices operating in the mid-IR spectrum using our scanning thermal microscopy and demonstrate its advantages over conventional NSOM technique.",
author = "Meir Grajower and Yoel Sebbag and Alex Naiman and Boris Desiatov and Uriel Levy",
year = "2015",
month = may,
day = "4",
doi = "10.1364/CLEO_SI.2015.STu4I.4",
language = "American English",
series = "CLEO: Science and Innovations, CLEO-SI 2015",
publisher = "Optical Society of America (OSA)",
pages = "2267",
booktitle = "CLEO",
note = "CLEO: Science and Innovations, CLEO-SI 2015 ; Conference date: 10-05-2015 Through 15-05-2015",
}