TY - GEN
T1 - Near field optical measurements of silicon waveguide in Mid-IR regime using scanning thermal microscopy
AU - Grajower, Meir
AU - Sebbag, Yoel
AU - Naiman, Alex
AU - Desiatov, Boris
AU - Levy, Uriel
PY - 2015/5/4
Y1 - 2015/5/4
N2 - We observe for the first time the near field optical intensity distribution of silicon nanophotonic devices operating in the mid-IR spectrum using our scanning thermal microscopy and demonstrate its advantages over conventional NSOM technique.
AB - We observe for the first time the near field optical intensity distribution of silicon nanophotonic devices operating in the mid-IR spectrum using our scanning thermal microscopy and demonstrate its advantages over conventional NSOM technique.
UR - http://www.scopus.com/inward/record.url?scp=84935476789&partnerID=8YFLogxK
U2 - 10.1364/CLEO_SI.2015.STu4I.4
DO - 10.1364/CLEO_SI.2015.STu4I.4
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AN - SCOPUS:84935476789
T3 - CLEO: Science and Innovations, CLEO-SI 2015
SP - 2267
BT - CLEO
PB - Optical Society of America (OSA)
T2 - CLEO: Science and Innovations, CLEO-SI 2015
Y2 - 10 May 2015 through 15 May 2015
ER -