Near-field pattern of a scanning aperture microwave probe: Experimental determination and computer simulations

M. Golosovsky; A. F. Lann; D. Davidov; A. Frenkel

doi:10.1109/EEEI.2000.924311

Near-field pattern of a scanning aperture microwave probe: Experimental determination and computer simulations

M. Golosovsky
, A. F. Lann
, D. Davidov
, A. Frenkel

Racah Institute of Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We study imaging properties of a microwave scanning probe consisting of a thin slit aperture in the waveguide endwall. We perform vector measurements of the near-field reflectivity of test samples (conducting dot, stripe, half-plane, plane) at various probe-sample separations and orientations. The experimental results for small objects agree fairly well with analytical calculations and computer simulations and may be described by a quasistatic model. Experimental results for extended conducting objects show strong deviations from a quasistatic model probably due to excitation of the surface waves. Experimental results show several peculiar near-field features which has not been properly addressed in the context of near-field imaging, namely, (i) strong collimation of the fields away from the probe up to a distance equal to the probe width, (ii) very weak phase dependence on distance, (iii) excitation of surface waves above conducting surfaces.

Original language	English
Title of host publication	21st IEEE Convention of the Electrical and Electronic Engineers in Israel, Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	33-36
Number of pages	4
ISBN (Electronic)	0780358422, 9780780358423
DOIs	https://doi.org/10.1109/EEEI.2000.924311
State	Published - 2000
Event	21st IEEE Convention of the Electrical and Electronic Engineers in Israel, IEEEI 2000 - Tel-Aviv, Israel Duration: 11 Apr 2000 → 12 Apr 2000

Publication series

Name	21st IEEE Convention of the Electrical and Electronic Engineers in Israel, Proceedings

Conference

Conference	21st IEEE Convention of the Electrical and Electronic Engineers in Israel, IEEEI 2000
Country/Territory	Israel
City	Tel-Aviv
Period	11/04/00 → 12/04/00

Bibliographical note

Publisher Copyright:
©2000 IEEE.

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10.1109/EEEI.2000.924311

Cite this

Golosovsky, M., Lann, A. F., Davidov, D., & Frenkel, A. (2000). Near-field pattern of a scanning aperture microwave probe: Experimental determination and computer simulations. In 21st IEEE Convention of the Electrical and Electronic Engineers in Israel, Proceedings (pp. 33-36). Article 924311 (21st IEEE Convention of the Electrical and Electronic Engineers in Israel, Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EEEI.2000.924311

Golosovsky, M. ; Lann, A. F. ; Davidov, D. et al. / Near-field pattern of a scanning aperture microwave probe : Experimental determination and computer simulations. 21st IEEE Convention of the Electrical and Electronic Engineers in Israel, Proceedings. Institute of Electrical and Electronics Engineers Inc., 2000. pp. 33-36 (21st IEEE Convention of the Electrical and Electronic Engineers in Israel, Proceedings).

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abstract = "We study imaging properties of a microwave scanning probe consisting of a thin slit aperture in the waveguide endwall. We perform vector measurements of the near-field reflectivity of test samples (conducting dot, stripe, half-plane, plane) at various probe-sample separations and orientations. The experimental results for small objects agree fairly well with analytical calculations and computer simulations and may be described by a quasistatic model. Experimental results for extended conducting objects show strong deviations from a quasistatic model probably due to excitation of the surface waves. Experimental results show several peculiar near-field features which has not been properly addressed in the context of near-field imaging, namely, (i) strong collimation of the fields away from the probe up to a distance equal to the probe width, (ii) very weak phase dependence on distance, (iii) excitation of surface waves above conducting surfaces.",

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Golosovsky, M, Lann, AF, Davidov, D & Frenkel, A 2000, Near-field pattern of a scanning aperture microwave probe: Experimental determination and computer simulations. in 21st IEEE Convention of the Electrical and Electronic Engineers in Israel, Proceedings., 924311, 21st IEEE Convention of the Electrical and Electronic Engineers in Israel, Proceedings, Institute of Electrical and Electronics Engineers Inc., pp. 33-36, 21st IEEE Convention of the Electrical and Electronic Engineers in Israel, IEEEI 2000, Tel-Aviv, Israel, 11/04/00. https://doi.org/10.1109/EEEI.2000.924311

Near-field pattern of a scanning aperture microwave probe: Experimental determination and computer simulations. / Golosovsky, M.; Lann, A. F.; Davidov, D. et al.
21st IEEE Convention of the Electrical and Electronic Engineers in Israel, Proceedings. Institute of Electrical and Electronics Engineers Inc., 2000. p. 33-36 924311 (21st IEEE Convention of the Electrical and Electronic Engineers in Israel, Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Golosovsky M, Lann AF, Davidov D, Frenkel A. Near-field pattern of a scanning aperture microwave probe: Experimental determination and computer simulations. In 21st IEEE Convention of the Electrical and Electronic Engineers in Israel, Proceedings. Institute of Electrical and Electronics Engineers Inc. 2000. p. 33-36. 924311. (21st IEEE Convention of the Electrical and Electronic Engineers in Israel, Proceedings). doi: 10.1109/EEEI.2000.924311

Near-field pattern of a scanning aperture microwave probe: Experimental determination and computer simulations

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