Near field phase mapping exploiting intrinsic oscillations of aperture NSOM probe

Liron Stern, Boris Desiatov, Ilya Goykhman, Gilad M. Lerman, Uriel Levy*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

17 Scopus citations

Abstract

An innovative, simple, compact and low cost approach for phase mapping based on the intrinsic modulation of an aperture Near Field Scanning Optical Microscope probe is analyzed and experimentally demonstrated. Several nanoscale silicon waveguides are phase-mapped using this approach, and the different modes of propagation are obtained via Fourier analysis. The obtained measured results are in good agreement with the effective indexes of the modes calculated by electromagnetic simulations. Owing to its simplicity and effectiveness, the demonstrated system is a potential candidate for integration with current near field systems for the characterization of nanophotonic components and devices.

Original languageEnglish
Pages (from-to)12014-12020
Number of pages7
JournalOptics Express
Volume19
Issue number13
DOIs
StatePublished - 20 Jun 2011

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