New insights into lamellar twisting in transcrystalline polyethylene

Stanislav Ratner*, P. Mona Moret, Ellen Wachtel, Gad Marom

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

13 Scopus citations

Abstract

The morphology of the transcrystalline layer grown by nucleating high density polyethylene of fibers of ultra high molecular weight polyethylene was investigated by microbeam synchrotrom X-ray diffraction. Scanning with a 2 micron step size, it was possible to determine that near the fiber surface, the polymer chains of the transcrystalline layer are oriented at an angle of approx. 41° with respect to the fiber axis. This is consistent with the lamellar fold surface (the {201} plane) being close to perpendicular to the fiber axis. the X-ray data support gradual twisting of the lamellae about the growth direction (the orthorhombic crystallite b-axis) at a rate of ∼0.85° per micron of radial distance from the fiber surface.

Original languageEnglish
Pages (from-to)1183-1189
Number of pages7
JournalMacromolecular Chemistry and Physics
Volume206
Issue number12
DOIs
StatePublished - 16 Jun 2005

Keywords

  • Lamellar twisting
  • PE/PE composite
  • Synchrotron
  • Transcrystalline layer

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