We examine the effect of different sources of technical noise on inverse weak value-based precision phase measurements. We find that this type of measurement is similarly robust to technical noise as related experiments in the weak value regime. In particular, the measurements considered here are robust to additive Gaussian white noise and angular jitter noise commonly encountered in optical experiments. Additionally, we show the same techniques used for precision phase measurement can be used with the same technical advantages for optical frequency measurements.
Bibliographical noteFunding Information:
This work was supported by DRS Technologies and Army Research Office Grant no. W911NF-13-1-0402.
© 2017, Chapman University.
- Precision frequency measurements
- Precision phase measurements
- Technical noise
- Weak value amplification
- Weak values