Non-critical behaviour of the Hall-coefficient at the mobility edge

E. Tousson; Z. Ovadyahu

doi:10.1016/0038-1098(86)90761-1

Non-critical behaviour of the Hall-coefficient at the mobility edge

E. Tousson^*, Z. Ovadyahu

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

19 Scopus citations

Abstract

Measurements of the Hall-coefficient, R_H for In₂O_3-x samples with K_Fl = 0.03 to ∼8.5 are reported. In this range of disorder, the low-temperature conductivity varies over 4 decades. R_H however, exhibits "classical" metallic behaviour down to 1.4 K.

Original language	English
Pages (from-to)	407-410
Number of pages	4
Journal	Solid State Communications
Volume	60
Issue number	4
DOIs	https://doi.org/10.1016/0038-1098(86)90761-1
State	Published - Oct 1986
Externally published	Yes

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title = "Non-critical behaviour of the Hall-coefficient at the mobility edge",

abstract = "Measurements of the Hall-coefficient, RH for In2O3-x samples with KFl = 0.03 to ∼8.5 are reported. In this range of disorder, the low-temperature conductivity varies over 4 decades. RH however, exhibits {"}classical{"} metallic behaviour down to 1.4 K.",

author = "E. Tousson and Z. Ovadyahu",

year = "1986",

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doi = "10.1016/0038-1098(86)90761-1",

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AU - Ovadyahu, Z.

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AB - Measurements of the Hall-coefficient, RH for In2O3-x samples with KFl = 0.03 to ∼8.5 are reported. In this range of disorder, the low-temperature conductivity varies over 4 decades. RH however, exhibits "classical" metallic behaviour down to 1.4 K.

UR - https://www.scopus.com/pages/publications/11544265988

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JO - Solid State Communications

JF - Solid State Communications

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Non-critical behaviour of the Hall-coefficient at the mobility edge

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