We report observations of glass behavior of an electronic system in an Anderson insulator. The system used is a MOSFET-like structure with a thin film of In2O3-x serving as the active element. The glassy behavior is reflected as a local minimum at the 'cool-down' gate voltage in the conductance vs. gate-voltage. G(Vg) sweeps. Relaxation is monitored as a function of temperature and film disorder. Studying certain features of the G(Vg) minima reveals that interactions are important in the relaxation process.
|Original language||American English|
|Number of pages||4|
|Journal||Physica Status Solidi (B): Basic Research|
|State||Published - Jan 1998|