Non-Equilibrium Transport in Anderson Insulators

A. Vaknin*, Z. Ovadyahu, M. Pollak

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Scopus citations


We report observations of glass behavior of an electronic system in an Anderson insulator. The system used is a MOSFET-like structure with a thin film of In2O3-x serving as the active element. The glassy behavior is reflected as a local minimum at the 'cool-down' gate voltage in the conductance vs. gate-voltage. G(Vg) sweeps. Relaxation is monitored as a function of temperature and film disorder. Studying certain features of the G(Vg) minima reveals that interactions are important in the relaxation process.

Original languageAmerican English
Pages (from-to)395-398
Number of pages4
JournalPhysica Status Solidi (B): Basic Research
Issue number1
StatePublished - Jan 1998


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