Abstract
We report observations of glass behavior of an electronic system in an Anderson insulator. The system used is a MOSFET-like structure with a thin film of In2O3-x serving as the active element. The glassy behavior is reflected as a local minimum at the 'cool-down' gate voltage in the conductance vs. gate-voltage. G(Vg) sweeps. Relaxation is monitored as a function of temperature and film disorder. Studying certain features of the G(Vg) minima reveals that interactions are important in the relaxation process.
Original language | English |
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Pages (from-to) | 395-398 |
Number of pages | 4 |
Journal | Physica Status Solidi (B): Basic Research |
Volume | 205 |
Issue number | 1 |
DOIs | |
State | Published - Jan 1998 |