Non-Gaussian noise in quantum wells infrared photodetectors

Non-Gaussian dark current noise has been observed in quantum wells infrared photo detectors. The non-Gaussian component of the noise was ascribed to fluctuations of spatial distribution of electric field in the device. Non-Gaussian noise was found in both n- and p-type QWIPs, however, it was significantly less pronounce. In n-type devices non-Gaussian noise manifests itself only as randomly distributed excess current bursts. In p-type QWIPs the non-Gaussian noise takes form of bias dependent random telegraph-like fluctuations with a finite time of transition between the levels. The lifetime at both levels is Poisson distributed and the average lifetime, together with the level spacing, strongly depend on bias voltage. At low voltages the system stays predominantly in the low current level while at higher voltages the average lifetime of the high current level is longer. The transient time of passing between the states has been related to the charging time constant of the system determined by QWIP capacitance and contacts resistance.