TY - JOUR
T1 - Nonlinear emission due to electron-polariton scattering in a semiconductor microcavity
AU - Mann, A.
AU - Pfeiffer, L. N.
AU - Qarry, A.
AU - Cohen, E.
AU - Ron, Arza
AU - Linder, E.
AU - Ramon, G.
AU - Rapaport, R.
PY - 2003
Y1 - 2003
N2 - Electron-polariton scattering is studied by photoluminescence spectroscopy in a GaAs/AlGaAs microcavity with an embedded quantum well containing a variable density electron gas. The photoluminescence spectra are measured as a function of two parameters: (a) The detuning energy between the cavity-confined photon and the heavy exciton and (b) the intensity of the laser that generates the electron gas. The integrated photoluminescence intensity varies nonlinearly with increasing electron density, showing a large enhancement that reaches a factor of 35 over the intensity observed without an electron gas. The spectra are analyzed in the strong coupling regime, by calculating the energy and electron gas density dependence of the electron-polariton scattering rates. The most effective scattering process is the dissociation of the charged exciton component in the polariton states.
AB - Electron-polariton scattering is studied by photoluminescence spectroscopy in a GaAs/AlGaAs microcavity with an embedded quantum well containing a variable density electron gas. The photoluminescence spectra are measured as a function of two parameters: (a) The detuning energy between the cavity-confined photon and the heavy exciton and (b) the intensity of the laser that generates the electron gas. The integrated photoluminescence intensity varies nonlinearly with increasing electron density, showing a large enhancement that reaches a factor of 35 over the intensity observed without an electron gas. The spectra are analyzed in the strong coupling regime, by calculating the energy and electron gas density dependence of the electron-polariton scattering rates. The most effective scattering process is the dissociation of the charged exciton component in the polariton states.
UR - http://www.scopus.com/inward/record.url?scp=85038891875&partnerID=8YFLogxK
U2 - 10.1103/PhysRevB.67.115320
DO - 10.1103/PhysRevB.67.115320
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AN - SCOPUS:85038891875
SN - 1098-0121
VL - 67
SP - 5
JO - Physical Review B - Condensed Matter and Materials Physics
JF - Physical Review B - Condensed Matter and Materials Physics
IS - 11
ER -