Nonlinear scanning laser microscopy by third harmonic generation

Y. Barad; H. Eisenberg; M. Horowitz; Y. Silberberg

doi:10.1063/1.118442

Nonlinear scanning laser microscopy by third harmonic generation

Y. Barad^*, H. Eisenberg, M. Horowitz, Y. Silberberg

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

598 Scopus citations

Abstract

Third harmonic generation near the focal point of a tightly focused beam is used to probe microscopical structures of transparent samples. It is shown that this method can resolve interfaces and inhomogeneities with axial resolution comparable to the confocal length of the beam. Using 120 fs pulses at 1.5 μm, we were able to resolve interfaces with a resolution of 1.2 μm. Two-dimensional cross-sectional images have also been produced.

Original language	English
Pages (from-to)	922-924
Number of pages	3
Journal	Applied Physics Letters
Volume	70
Issue number	8
DOIs	https://doi.org/10.1063/1.118442
State	Published - 24 Feb 1997
Externally published	Yes

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title = "Nonlinear scanning laser microscopy by third harmonic generation",

abstract = "Third harmonic generation near the focal point of a tightly focused beam is used to probe microscopical structures of transparent samples. It is shown that this method can resolve interfaces and inhomogeneities with axial resolution comparable to the confocal length of the beam. Using 120 fs pulses at 1.5 μm, we were able to resolve interfaces with a resolution of 1.2 μm. Two-dimensional cross-sectional images have also been produced.",

author = "Y. Barad and H. Eisenberg and M. Horowitz and Y. Silberberg",

year = "1997",

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AU - Silberberg, Y.

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AB - Third harmonic generation near the focal point of a tightly focused beam is used to probe microscopical structures of transparent samples. It is shown that this method can resolve interfaces and inhomogeneities with axial resolution comparable to the confocal length of the beam. Using 120 fs pulses at 1.5 μm, we were able to resolve interfaces with a resolution of 1.2 μm. Two-dimensional cross-sectional images have also been produced.

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Nonlinear scanning laser microscopy by third harmonic generation

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