Nonlinear scanning laser microscopy by third harmonic generation

Y. Barad*, H. Eisenberg, M. Horowitz, Y. Silberberg

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

596 Scopus citations

Abstract

Third harmonic generation near the focal point of a tightly focused beam is used to probe microscopical structures of transparent samples. It is shown that this method can resolve interfaces and inhomogeneities with axial resolution comparable to the confocal length of the beam. Using 120 fs pulses at 1.5 μm, we were able to resolve interfaces with a resolution of 1.2 μm. Two-dimensional cross-sectional images have also been produced.

Original languageAmerican English
Pages (from-to)922-924
Number of pages3
JournalApplied Physics Letters
Volume70
Issue number8
DOIs
StatePublished - 24 Feb 1997
Externally publishedYes

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